SPIE Proceedings [SPIE Lightmetry 2002 - Warsaw, Poland (Tuesday 14 May 2002)] Lightmetry 2002: Metrology and Testing Techniques Using Light - Growth control of polymer films deposited on the planar waveguide
Augusciuk, Elzbieta, Roszko, Marcin, Fabianowski, Wojciech, Pluta, Maksymilian, Szyjer, MariuszVolume:
5064
Year:
2003
Language:
english
DOI:
10.1117/12.501526
File:
PDF, 194 KB
english, 2003