SPIE Proceedings [SPIE Optical Science and Technology, SPIE's 48th Annual Meeting - San Diego, California, USA (Sunday 3 August 2003)] Recent Developments in Traceable Dimensional Measurements II - 5-m measurement system for traceable measurements of tapes and rules
Yandayan, Tanfer, Decker, Jennifer E., Brown, Nicholas, Ozgur, BulentVolume:
5190
Year:
2003
Language:
english
DOI:
10.1117/12.505579
File:
PDF, 461 KB
english, 2003