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SPIE Proceedings [SPIE Asia-Pacific Optical and Wireless Communications - Wuhan, China (Sunday 2 November 2003)] Materials, Active Devices, and Optical Amplifiers - Advances in the spectroscopic characterization of vertical-cavity opto-electronic devices and structures using modulated reflectance
Hosea, Thomas J.Volume:
5280
Year:
2003
Language:
english
DOI:
10.1117/12.519965
File:
PDF, 265 KB
english, 2003