SPIE Proceedings [SPIE NDE for Health Monitoring and...

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SPIE Proceedings [SPIE NDE for Health Monitoring and Diagnostics - San Diego, CA (Sunday 14 March 2004)] Testing, Reliability, and Application of Micro- and Nano-Material Systems II - NDE of microstructured materials by x-ray diffraction and refraction topography

Hentschel, Manfred P., Meyendorf, Norbert, Baaklini, George Y., Lange, Axel, Harbich, K.-Wolfram, Michel, Bernd, Schors, Joerg, Wald, Oliver, Mueller, Bernd R.
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Volume:
5392
Year:
2004
Language:
english
DOI:
10.1117/12.541532
File:
PDF, 1.13 MB
english, 2004
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