SPIE Proceedings [SPIE Second International Symposium on Fluctuations and Noise - Maspalomas, Gran Canaria Island, Spain (Tuesday 25 May 2004)] Noise in Devices and Circuits II - Influence of 2D electrostatic effects on the high-frequency noise behavior of sub-100-nm scaled MOSFETs
Danneville, Francois, Rengel, Raul, Pardo, Daniel, Bonani, Fabrizio, Deen, M. Jamal, Martin, Maria J., Levinshtein, Michael E.Volume:
5470
Year:
2004
Language:
english
DOI:
10.1117/12.546966
File:
PDF, 388 KB
english, 2004