SPIE Proceedings [SPIE Process Module Metrology, Control...

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SPIE Proceedings [SPIE Process Module Metrology, Control and Clustering - San Jose, United States (Wednesday 11 September 1991)] Process Module Metrology, Control and Clustering - Adaptive photolithography control using development time manipulation

Soper, Robert A., Mellichamp, Duncan A., Seborg, Dale E., Davis, Cecil J., Herman, Irving P., Turner, Terry R.
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Volume:
1594
Year:
1992
Language:
english
DOI:
10.1117/12.56642
File:
PDF, 788 KB
english, 1992
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