SPIE Proceedings [SPIE Photonics Asia 2004 - Beijing, China (Monday 8 November 2004)] Nanophotonics, Nanostructure, and Nanometrology - Influence of the bandwidth of an acquisition system on the trap stiffness measurement
Gong, Zan, Zhu, Xing, Chou, Stephen Y., Chen, Hongtao, Xu, Shenghua, Arakawa, Yasuhiko, Li, Yinmei, Lou, LirenVolume:
5635
Year:
2004
Language:
english
DOI:
10.1117/12.569877
File:
PDF, 55 KB
english, 2004