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SPIE Proceedings [SPIE Photonics Asia 2004 - Beijing, China (Monday 8 November 2004)] Optical Design and Testing II - Research on modern testing technique of optical system resolution based on CCD imaging theory and DLP occurring figure device
Li, Zhenhui, Wang, Yongtian, Weng, Zhicheng, Li, Lijuan, Zeng, Chang'e, Ye, Shenghua, Sasian, Jose M., An, ZhiyongVolume:
5638
Year:
2004
Language:
english
DOI:
10.1117/12.575052
File:
PDF, 163 KB
english, 2004