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SPIE Proceedings [SPIE Electronic Imaging 2005 - San Jose, CA (Monday 17 January 2005)] Image Quality and System Performance II - Image quality evaluation: the data mining approach
Cui, Chengwu, Rasmussen, Rene, Miyake, YoichiVolume:
5668
Year:
2005
Language:
english
DOI:
10.1117/12.585960
File:
PDF, 248 KB
english, 2005