![](/img/cover-not-exists.png)
SPIE Proceedings [SPIE Optical Metrology - Munich, Germany (Monday 13 June 2005)] Optical Measurement Systems for Industrial Inspection IV - On-line non-contact measuring of synchronizer hubs
Fraga, Cesar, Osten, Wolfgang, Gorecki, Christophe, Enguita, Jose M., Alvarez, Ignacio, Novak, Erik L., Marina, Jorge, Martinez, NestorVolume:
5856
Year:
2005
Language:
english
DOI:
10.1117/12.612258
File:
PDF, 477 KB
english, 2005