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SPIE Proceedings [SPIE Optical Metrology - Munich, Germany (Monday 13 June 2005)] Optical Measurement Systems for Industrial Inspection IV - CCD based emissivity measurements for surface characterization in heat treatment processes
Zauner, Gerald, Osten, Wolfgang, Gorecki, Christophe, Darilion, Gerald, Heim, Daniel, Novak, Erik L., Hendorfer, G., Mueller, ThomasVolume:
5856
Year:
2005
Language:
english
DOI:
10.1117/12.612525
File:
PDF, 379 KB
english, 2005