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SPIE Proceedings [SPIE Optics & Photonics 2005 - San Diego, California, USA (Sunday 31 July 2005)] Advanced Wavefront Control: Methods, Devices, and Applications III - The construction of individual eye model based on eye's wavefront aberration measurement
Gruneisen, Mark T., Wang, Zhao-Qi, Guo, Huan-Qing, Gonglewski, John D., Giles, Michael K.Volume:
5894
Year:
2005
Language:
english
DOI:
10.1117/12.612819
File:
PDF, 198 KB
english, 2005