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SPIE Proceedings [SPIE Congress on Optics and Optoelectronics - Warsaw, Poland (Sunday 28 August 2005)] Photonics Applications in Industry and Research IV - OCT system for plant measurement
Shiina, Tatsuo, Romaniuk, Ryszard S., Simrock, Stefan, Kishiwaki, Daisuke, Ito, Masafumi, Lutkovski, Vladimir M., Honda, Toshio, Okamura, YasuyukiVolume:
5948
Year:
2005
Language:
english
DOI:
10.1117/12.622686
File:
PDF, 656 KB
english, 2005