SPIE Proceedings [SPIE Emerging OE Technologies, Bangalore,...

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SPIE Proceedings [SPIE Emerging OE Technologies, Bangalore, India - Bangalore, India (Monday 16 December 1991)] Emerging Optoelectronic Technologies - Determination of the refractive index profile of integrated optical waveguides from near-field measurements

Halfmann, M., Sumichrast, Lubomir, Heinlein, Walter E., Shenai, Krishna, Selvarajan, Ananth, Patel, C. K. N., Rao, C. N. R., Sonde, B. S., Tripathi, Vijai K.
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Volume:
1622
Year:
1992
Language:
english
DOI:
10.1117/12.637018
File:
PDF, 221 KB
english, 1992
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