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SPIE Proceedings [SPIE Integrated Optoelectronic Devices 2006 - San Jose, CA (Saturday 21 January 2006)] Novel In-Plane Semiconductor Lasers V - Defects and degradation of nitride-based laser diodes
Tomiya, Shigetaka, Mermelstein, Carmen, Bour, David P., Hino, Tomonori, Miyajima, Takao, Goto, Osamu, Ikeda, MasaoVolume:
6133
Year:
2006
Language:
english
DOI:
10.1117/12.643288
File:
PDF, 2.84 MB
english, 2006