SPIE Proceedings [SPIE Integrated Optoelectronic Devices 2006 - San Jose, CA (Saturday 21 January 2006)] Photonics Packaging and Integration VI - Edge termination effects on finite aperture polarizers for polarimetric imaging applications at mid wave IR
Cruz-Cabrera, A. A., Earman, Allen M., Chen, Ray T., Kemme, S. A., Wendt, J. R., Boye, R. R., Carter, T. R., Samora, S.Volume:
6126
Year:
2006
Language:
english
DOI:
10.1117/12.644310
File:
PDF, 880 KB
english, 2006