SPIE Proceedings [SPIE ICO20:Optical Design and Fabrication - Changchun, China (Sunday 21 August 2005)] ICO20: Optical Design and Fabrication - Research iris serial images quality assessment method based on HVS
Li, Zhi-hui, Breckinridge, James, Wang, Yongtian, Zhang, Chang-hai, Ming, Xing, Zhao, Yong-huaVolume:
6034
Year:
2005
Language:
english
DOI:
10.1117/12.668167
File:
PDF, 446 KB
english, 2005