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SPIE Proceedings [SPIE 2nd international Symposium on Advanced Optical Manufacturing and Testing Technologies - Xian, China (Wednesday 2 November 2005)] 2nd International Symposium on Advanced Optical Manufacturing and Testing Technologies: Advanced Optical Manufacturing Technologies - Investigation of photoelectron properties in cubic AgCl emulsion with uniformly doped formate ions
Fu, Guang-Sheng, Yang, Li, Wen, Shangming, Zhou, Xian, Yang, Shao-Peng, Chen, Yaolong, Kley, Ernst-Bernhard, Li, Xiao-Wei, Tian, Xiao-Dong, Han, LiVolume:
6149
Year:
2005
Language:
english
DOI:
10.1117/12.674258
File:
PDF, 232 KB
english, 2005