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SPIE Proceedings [SPIE SPIE Optics + Photonics - San Diego, California, USA (Sunday 13 August 2006)] Interferometry XIII: Techniques and Analysis - Speckle photography: linear canonical transform metrology systems in mixed domains with apertures
Ward, Jennifer E., Kelly, Damien P., Hennelly, Bryan M., Patten, Robert F., Sheridan, John T.Volume:
6292
Year:
2006
Language:
english
DOI:
10.1117/12.680761
File:
PDF, 586 KB
english, 2006