SPIE Proceedings [SPIE Lasers and Applications in Science and Engineering - San Jose, CA (Saturday 20 January 2007)] High-Power Diode Laser Technology and Applications V - Degradation behavior and thermal properties of red (650 nm) high-power diode single emitters and laser bars
Tomm, Jens W., Zediker, Mark S., Tien, Tran Q., Ziegler, Mathias, Weik, Fritz, Sumpf, Bernd, Zorn, Martin, Zeimer, Ute, Erbert, GötzVolume:
6456
Year:
2007
Language:
english
DOI:
10.1117/12.696552
File:
PDF, 822 KB
english, 2007