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SPIE Proceedings [SPIE Optical Engineering + Applications - San Diego, CA (Sunday 26 August 2007)] Optical Manufacturing and Testing VII - Speckle metrology based study on the effect of chattering on machined surfaces
Ashok, Praveen Cheriyan, Burge, James H., Faehnle, Oliver W., Nair, Usha, Kas, Varun, Williamson, Ray, Namboothiri, V. N. N., Nampoori, V. P. N.Volume:
6671
Year:
2007
Language:
english
DOI:
10.1117/12.733099
File:
PDF, 886 KB
english, 2007