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SPIE Proceedings [SPIE Optics East 2007 - Boston, MA (Sunday 9 September 2007)] Wavelet Applications in Industrial Processing V - Wavelet coherence analysis applied to laser vibrometry measurements
Zauner, G., Truchetet, Frédéric, Laligant, Olivier, Ramsauer, C., Hendorfer, G.Volume:
6763
Year:
2007
Language:
english
DOI:
10.1117/12.733815
File:
PDF, 1.73 MB
english, 2007