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SPIE Proceedings [SPIE Integrated Optoelectronic Devices 2008 - San Jose, CA (Saturday 19 January 2008)] Silicon Photonics III - Porous silicon surface feature size estimation using the reflectance spectrum
Lowrie, Christopher, Kubby, Joel A., Reed, Graham T., Earles, Susan, de Fernandez, M.Volume:
6898
Year:
2008
Language:
english
DOI:
10.1117/12.759323
File:
PDF, 311 KB
english, 2008