SPIE Proceedings [SPIE Integrated Optoelectronic Devices...

  • Main
  • SPIE Proceedings [SPIE Integrated...

SPIE Proceedings [SPIE Integrated Optoelectronic Devices 2008 - San Jose, CA (Saturday 19 January 2008)] Silicon Photonics III - Porous silicon surface feature size estimation using the reflectance spectrum

Lowrie, Christopher, Kubby, Joel A., Reed, Graham T., Earles, Susan, de Fernandez, M.
How much do you like this book?
What’s the quality of the file?
Download the book for quality assessment
What’s the quality of the downloaded files?
Volume:
6898
Year:
2008
Language:
english
DOI:
10.1117/12.759323
File:
PDF, 311 KB
english, 2008
Conversion to is in progress
Conversion to is failed