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SPIE Proceedings [SPIE MOEMS-MEMS 2008 Micro and Nanofabrication - San Jose, CA (Saturday 19 January 2008)] MOEMS and Miniaturized Systems VII - Dual-detector optical MEMS spectrum analyzer: advances, applications, and prospects
Otto, Thomas, Dickensheets, David L., Schenk, Harald, Saupe, Ray, Weiss, Alexander, Stock, Volker, Wiesner, Kerstin, Lampe, Uwe, Fleischer, Maximilian, Gessner, ThomasVolume:
6887
Year:
2008
Language:
english
DOI:
10.1117/12.768356
File:
PDF, 984 KB
english, 2008