SPIE Proceedings [SPIE 3rd International Symposium on...

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SPIE Proceedings [SPIE 3rd International Symposium on Advanced Optical Manufacturing and Testing Technologies: Advanced Optical Manufacturing Technologies - Chengdu, China (Sunday 8 July 2007)] 3rd International Symposium on Advanced Optical Manufacturing and Testing Technologies: Advanced Optical Manufacturing Technologies - Design and fabrication of x-ray Kirkpatrick-Baez microscope for ICF

Mu, Baozhong, Yang, Li, Chen, Yaolong, Wang, Zhanshan, Huang, Shengling, Kley, Ernst-Bernhard, Li, Rongbin, Yi, Shengzhen, Shen, Zhengxiang
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Volume:
6722
Year:
2007
Language:
english
DOI:
10.1117/12.782896
File:
PDF, 706 KB
english, 2007
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