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SPIE Proceedings [SPIE Seventh International Symposium on Instrumentation and Control Technology - Beijing, China (Friday 10 October 2008)] Seventh International Symposium on Instrumentation and Control Technology: Sensors and Instruments, Computer Simulation, and Artificial Intelligence - Surface smoothness detection algorithm based on two-dimensional wavelet and computer vision
Yang, Jian, Fang, Jiancheng, Wang, Zhongyu, Lu, Nai-Guang, Dong, MingliVolume:
7127
Year:
2008
Language:
english
DOI:
10.1117/12.806352
File:
PDF, 422 KB
english, 2008