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SPIE Proceedings [SPIE SPIE LASE: Lasers and Applications in Science and Engineering - San Jose, CA (Saturday 24 January 2009)] High-Power Diode Laser Technology and Applications VII - Reliability of single-mode and multi-mode high-power semiconductor lasers at eye-safe wavelengths
Stakelon, T., Zediker, Mark S., Lucas, J., Osowski, M., Lammert, R., Moon, S., Panja, C., Elarde, V., Gallup, K., Hu, W., Ungar, J.Volume:
7198
Year:
2009
Language:
english
DOI:
10.1117/12.807881
File:
PDF, 253 KB
english, 2009