SPIE Proceedings [SPIE SPIE OPTO: Integrated Optoelectronic Devices - San Jose, CA (Saturday 24 January 2009)] Gallium Nitride Materials and Devices IV - Improved surface morphology and edge definition for ohmic contacts to AlGaN/GaN heterostructures
Lan, Yung-Ling, Morkoç, Hadis, Litton, Cole W., Lin, Hung-Cheng, Liu, Hsueh-Hsing, Chyi, Jen-Inn, Nanishi, Yasushi, Lee, Geng-Yen, Ren, Fan, Piprek, Joachim, Yoon, Euijoon, Pearton, Stephen J., Chang,Volume:
7216
Year:
2009
Language:
english
DOI:
10.1117/12.810165
File:
PDF, 818 KB
english, 2009