![](/img/cover-not-exists.png)
SPIE Proceedings [SPIE IS&T/SPIE Electronic Imaging - San Jose, CA (Sunday 18 January 2009)] Wavelet Applications in Industrial Processing VI - New image quality measure based on wavelets
Dumic, Emil, Truchetet, Frederic, Laligant, Olivier, Grgic, Sonja, Grgic, MislavVolume:
7248
Year:
2009
Language:
english
DOI:
10.1117/12.810244
File:
PDF, 925 KB
english, 2009