SPIE Proceedings [SPIE SPIE NanoScience + Engineering - San Diego, CA (Sunday 2 August 2009)] Instrumentation, Metrology, and Standards for Nanomanufacturing III - Towards accurate and reproducible metrology of manufactured ZnO nanoparticles
Coleman, Victoria A., Postek, Michael T., Allgair, John A., La Fontaine, Arnaud, Endmann, Toni, Jämting, Åsa K., Herrmann, Jan, Miles, JohnVolume:
7405
Year:
2009
Language:
english
DOI:
10.1117/12.825713
File:
PDF, 1.35 MB
english, 2009