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SPIE Proceedings [SPIE SPIE Optical Engineering + Applications - San Diego, CA (Sunday 2 August 2009)] Optical Inspection and Metrology for Non-Optics Industries - Digital processing of an interferometric velocimeter for ballistic shock measurement
Kumar, Pankaj, Huang, Peisen S., Yoshizawa, Toru, Thomas, Akhil, Weis, R. Stephen, Harding, Kevin G., Tayag, Tristan J.Volume:
7432
Year:
2009
Language:
english
DOI:
10.1117/12.828498
File:
PDF, 962 KB
english, 2009