SPIE Proceedings [SPIE 4th International Symposium on Advanced Optical Manufacturing and testing technologies: Optical Test and Measurement Technology and Equipment - Chengdu, China (Wednesday 19 November 2008)] 4th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical Test and Measurement Technology and Equipment - Measurement of 850nm waveband up-conversion characters based on Er 3+ -doped silica fiber
Liu, Yang, Zhang, Yudong, Wyant, James C., Wang, Xiao-Bing, Wang, Hui-Sheng, Smythe, Robert A., Wang, Hexin, Wang, Shu-Yun, Wei, Shang-fangVolume:
7283
Year:
2008
Language:
english
DOI:
10.1117/12.828726
File:
PDF, 159 KB
english, 2008