SPIE Proceedings [SPIE 4th International Symposium on Advanced Optical Manufacturing and testing technologies: Optical Test and Measurement Technology and Equipment - Chengdu, China (Wednesday 19 November 2008)] 4th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical Test and Measurement Technology and Equipment - Research of measuring instrument with freeform surface
Wang, Yuanyuan, Zhang, Yudong, Wyant, James C., Yu, Jingchi, Ni, Ying, Smythe, Robert A., Wang, Hexin, Qu, Jia, Chen, HaoVolume:
7283
Year:
2008
Language:
english
DOI:
10.1117/12.828820
File:
PDF, 736 KB
english, 2008