SPIE Proceedings [SPIE International Symposium on Photoelectronic Detection and Imaging 2009 - Beijing, China (Wednesday 17 June 2009)] International Symposium on Photoelectronic Detection and Imaging 2009: Advances in Imaging Detectors and Applications - Adaptive defect correction and noise suppression module in the CIS image processing system
Wang, Su, Zhang, Kun, Wang, Xiang-jun, Yao, Su-ying, Faurie, Olivier, Zhang, Guang-jun, Ai, Ke-cong, Shi, Zai-fengVolume:
7384
Year:
2009
Language:
english
DOI:
10.1117/12.836651
File:
PDF, 6.02 MB
english, 2009