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SPIE Proceedings [SPIE IS&T/SPIE Electronic Imaging - San Jose, California (Sunday 17 January 2010)] Intelligent Robots and Computer Vision XXVII: Algorithms and Techniques - N-dimension closeness measurements used in dynamic pattern recognitions
Hu, Chialun John, Casasent, David P., Hall, Ernest L., Röning, JuhaVolume:
7539
Year:
2010
Language:
english
DOI:
10.1117/12.837107
File:
PDF, 409 KB
english, 2010