SPIE Proceedings [SPIE International Conference on Optical Instrumentation and Technology - Shanghai, China (Monday 19 October 2009)] 2009 International Conference on Optical Instruments and Technology: Optoelectronic Imaging and Process Technology - Image restoration for sparse aperture systems based on wavelet-Wiener algorithm
Zhu, Xifang, Yoshizawa, Toru, Wei, Ping, Wu, Feng, Wu, Quanying, Zheng, Jesse, Qian, LinVolume:
7513
Year:
2009
Language:
english
DOI:
10.1117/12.837680
File:
PDF, 1.55 MB
english, 2009