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SPIE Proceedings [SPIE 5th International Symposium on Advanced Optical Manufacturing and Testing Technologies - Dalian, China (Monday 26 April 2010)] 5th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical Test and Measurement Technology and Equipment - Research on the precision measurement of super-low reflectivity
Yuan, Hao-yu, Zhang, Yudong, Sasián, José, Lu, Zong-gui, Xia, Yan-wen, Xiang, Libin, To, Sandy, Peng, Zhi-tao, Liu, Hua, Xu, Long-bo, Sun, Zhi-hong, Tang, JunVolume:
7656
Year:
2010
Language:
english
DOI:
10.1117/12.866381
File:
PDF, 236 KB
english, 2010