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SPIE Proceedings [SPIE 5th International Symposium on Advanced Optical Manufacturing and Testing Technologies - Dalian, China (Monday 26 April 2010)] 5th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optoelectronic Materials and Devices for Detector, Imager, Display, and Energy Conversion Technology - Study of quantitative identification of infrared thermal wave testing based on BP neural networks
Wei, Zhang, Jiang, Ya-Dong, Kippelen, Bernard, Tao, Liu, Wei, Yangzheng, Yu, Junsheng, Min, ZhangruiVolume:
7658
Year:
2010
Language:
english
DOI:
10.1117/12.866394
File:
PDF, 402 KB
english, 2010