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SPIE Proceedings [SPIE Speckle 2010 - Florianapolis, Brazil (Monday 13 September 2010)] Speckle 2010: Optical Metrology - A speckle-photometry method of measurement of thermal diffusion coefficient of thin multilayer and nanoporous structures
Mukhurov, Nikolai I., Albertazzi Goncalves, Jr., Armando, Kaufmann, Guillermo H., Khilo, Nikolay A., Maschenko, Alexander G.Volume:
7387
Year:
2010
Language:
english
DOI:
10.1117/12.869942
File:
PDF, 730 KB
english, 2010