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SPIE Proceedings [SPIE Photonics Asia 2010 - Beijing, China (Monday 18 October 2010)] Optical Metrology and Inspection for Industrial Applications - Calibration target reconstruction for 3-D vision inspection system of large-scale engineering objects
Yin, Yongkai, Harding, Kevin, Huang, Peisen S., Peng, Xiang, Guan, Yingjian, Yoshizawa, Toru, Liu, Xiaoli, Li, AmengVolume:
7855
Year:
2010
Language:
english
DOI:
10.1117/12.870287
File:
PDF, 466 KB
english, 2010