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SPIE Proceedings [SPIE IS&T/SPIE Electronic Imaging - San Francisco Airport, California, USA (Sunday 23 January 2011)] Visualization and Data Analysis 2011 - Visualizing node attribute uncertainty in graphs
Cesario, Nathaniel, Pang, Alex, Singh, LisaVolume:
7868
Year:
2011
Language:
english
DOI:
10.1117/12.872677
File:
PDF, 1.84 MB
english, 2011