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SPIE Proceedings [SPIE Sixth International Symposium on Precision Engineering Measurements and Instrumentation - Hangzhou, China (Sunday 8 August 2010)] Sixth International Symposium on Precision Engineering Measurements and Instrumentation - Calibration and compensation of dual sensor system used in ultra precision diameter and form measuring instrument
Wu, Yong-bo, Xue, Zi, Zhan, WeiVolume:
7544
Year:
2010
Language:
english
DOI:
10.1117/12.885462
File:
PDF, 548 KB
english, 2010