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SPIE Proceedings [SPIE IS&T/SPIE Electronic Imaging - Burlingame, California, United States (Sunday 22 January 2012)] Sensors, Cameras, and Systems for Industrial and Scientific Applications XIII - 29-mp 35-mm format interline CCD image sensor
Meisenzahl, Eric J., Widenhorn, Ralf, Nguyen, Valérie, Carpenter, Douglas A., DiBella, James A., Dupret, Antoine, Doran, James, Fabinski, Robert P., Kosman, Stephen L., McCarten, John P.Volume:
8298
Year:
2012
Language:
english
DOI:
10.1117/12.909635
File:
PDF, 5.91 MB
english, 2012