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SPIE Proceedings [SPIE SPIE NanoScience + Engineering - San Diego, California, USA (Sunday 12 August 2012)] Instrumentation, Metrology, and Standards for Nanomanufacturing, Optics, and Semiconductors VI - A large-scale ceramic package of the CMOS image sensor chip for remote sensing application
Chang, Chia-Hung, Ling, Jer, Lo, Shih-Hung, Hsu, Wen-Chih, Liu, Cynthia, Postek, Michael T., Coleman, Victoria A., Orji, Ndubuisi G.Volume:
8466
Year:
2012
Language:
english
DOI:
10.1117/12.928388
File:
PDF, 780 KB
english, 2012