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SPIE Proceedings [SPIE 27th Annual Techincal Symposium - San Diego (Tuesday 23 August 1983)] Precision Surface Metrology - Subaperture Testing For Mid-Frequency Figure Control On Large Aspheric Mirrors
Slomba, A. F., Montagnino, L., Wyant, James C.Volume:
429
Year:
1983
Language:
english
DOI:
10.1117/12.936347
File:
PDF, 6.97 MB
english, 1983