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SPIE Proceedings [SPIE 28th Annual Technical Symposium - San Diego (Tuesday 21 August 1984)] Production Aspects of Single Point Machined Optics - On-Line Monitoring Of Surface Roughness By Using Laser

Kamei, Mitsuhito, Inari, Takahiko, Brehm, Donald P.
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Volume:
508
Year:
1984
Language:
english
DOI:
10.1117/12.944962
File:
PDF, 444 KB
english, 1984
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