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SPIE Proceedings [SPIE 1980 Technical Symposium East - Washington, D.C. (Tuesday 8 April 1980)] 1980 Intl Optical Computing Conf II - Interferometry With Polarization Sensitive Photographic Emulsion
Jonathan, J M., May, M., Rhodes, William T.Volume:
232
Year:
1980
Language:
english
DOI:
10.1117/12.958871
File:
PDF, 344 KB
english, 1980