SPIE Proceedings [SPIE 6th International Symposium on Advanced Optical Manufacturing and Testing Technologies (AOMATT 2012) - Xiamen, China (Thursday 26 April 2012)] 6th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical Test and Measurement Technology and Equipment - Spectral recognition of target based on the hyperspectral image data
Hu, Qili, Jia, Honghui, Wang, Xiaofeng, Chang, Shengli, Yang, Juncai, Zhang, Yudong, Xiang, Libin, To, SandyVolume:
8417
Year:
2012
Language:
english
DOI:
10.1117/12.977795
File:
PDF, 407 KB
english, 2012