Influence of interface point defect on the dielectric properties of Y doped CaCu 3 Ti 4 O12 ceramics
Deng, Jianming, Sun, Xiaojun, Liu, Saisai, Liu, Laijun, Yan, Tianxiang, Fang, Liang, Elouadi, BrahimVolume:
6
Language:
english
Journal:
Journal of Advanced Dielectrics
DOI:
10.1142/s2010135x16500090
Date:
March, 2016
File:
PDF, 669 KB
english, 2016