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[ECS 215th ECS Meeting - San Francisco, CA (May 24 - May 29, 2009)] ECS Transactions - Nanoscale Topography Measurements with a Metal Nanowire AFM Tip
Motoyama, Munekazu, Prinz, Friedrich B.Year:
2009
Language:
english
DOI:
10.1149/1.3246601
File:
PDF, 743 KB
english, 2009